Description

The ICP-MS sampler cone forms part of the interface region, sampling ions from the atmospheric plasma and transitioning them into the high vacuum MS for detection. High-quality sample cones are key to the sensitivity and stability of an ICP-MS. Agilent Sampler cones, with a nickel or platinum tip, use high-purity materials to minimize background and ensure stability within the plasma. They are manufactured to stringent specifications and rigorously tested to ensure excellent batch to batch reproducibility. The orifice dimensions and tip geometry are optimized and tightly controlled. Application: For 77/78/7900 & 88/8900. Standard Cone Used with S-Lens for Semiconductor Applications, Optional for Other Configurations. Recommended for Lower Limits of Detection (LODs) & for Higher-Matrix Samples. Required for Analysis of Aggressive Acids (especially HF) & when O2/Ar Option Gas is Used for Analyzing Organic Solvents. Use with Platinum Skimmer Cone & Brass Skimmer Base This product is only available to U.S. Domestic Customers. For research use only, not to be used in diagnostic procedures.